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0 索取号:TN78-53/E901/13 作者:Pulse Power Modulator Symposium (13th : 1978 : Buffalo)、IEEE Electron Devices Society、United States. Advisory Group on Electron Devices、State University of New York at Buffalo、 出版社:New York : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : available form IEEE Single Copy Sales, c1978
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0 索取号:TN713-53/E801 作者: 出版社:Eng. : P. Peregrinus on behalf of the Institution of Electrical Engineers, 1976.
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0 索取号:TN47-7/E901 作者:Compcon (22nd : 1981 : San Francisco、 Calif.)、IEEE Computer Society.、 出版社:New York, NY (345 E. 47th St., New York 10017) : Institute of Electrical and Electronics Engineers ; Los Alamitos, CA (10662 Los Vaqueros Circle, Los Alamitos 90720) : available from The Society, 1981.
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0 索取号:TN153-53/E801/10.3 作者:International Congress on Electron Microscopy (10th : 19882 : West Germany、 Hamburg.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、 出版社:West German Toronto : Hamburg Microscopical Society of Canada, 1982,c1978.
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0 索取号:R512.91-53/E991/1989 作者:International Conference on Gene Regulation、 Oncogenesis、 and AIDS (1st : 1989 : LoutŕАki、 Greece)、Papas、 Takis S.、 出版社:Woodlands, Texas : Portfolio Pub. Co. ; Houston : Gulf Pub. Co., Book Division, 1990.
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0 索取号:R540.1/E901 作者: 出版社:New York : Plenum Press, 1983.
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0 索取号:TH74-55/E803 作者: 出版社:[Redondo Beach, Calif., Society of Photo-optical Instrumentation Engineers, 1972]
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0 索取号:TK31-62/E801 作者:Wilhoit、 R. C.、Zwolinski、 Bruno John、 1919- joint author.、American Petroleum Institute. Research Project 44. Selected values of properties of hydrocarbons.、 出版社:College Station : Thermodynamics Research Center, Dept. of Chemistry, Texas A & M University, 1971.
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0 索取号:TM93-53/E902/11 作者:Test Conference (11th : 1980 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、 出版社:New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, 1980.
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0 索取号:TM93-53/E901/1982 作者:International Test Conference (1982)、IEEE Computer Society. Test Technology Committee.、International Test Foundation.、IEEE Computer Society.、IEEE Computer Society. Philadelphia Section.、 出版社:Silver Spring, MD (1109 Spring St., Suite 300) : IEEE Computer Society Press, 1982.
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0 索取号:TH74-55/E901/712 作者: 出版社:Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, 1987.
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0 索取号:R776.1-53/E801 作者:Cataract Surgical Congress、 5th、 Miami、 Fla.、 1977.、Emery、 Jared M.、 1940-、 出版社:Saint Louis : Mosby, 1978.
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0 索取号:R816/E901 作者: 出版社:London Philadelphia : Saunders, 1982.
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0 索取号:S-3/E901 作者: 出版社:Totowa, N.J. : Allanheld, Osmun, 1983.
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0 索取号:TB1-53/E801/1979 作者:Institute of Electrical and Electronics Engineers. Region 6.、Institute of Electrical and Electronics Engineers. Sacramento Section.、 出版社:New York : IEEE, 1979.
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0 索取号:S931/E991 作者: 出版社:Dordrecht ; Boston : Kluwer Academic, 1992.
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